ISO/TTA 3-2001 多晶材料中子衍射法测定剩余应力
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【英文标准名称】:Polycrystallinematerials-Determinationofresidualstressesbyneutrondiffraction
【原文标准名称】:多晶材料中子衍射法测定剩余应力
【标准号】:ISO/TTA3-2001
【标准状态】:现行
【国别】:国际
【发布日期】:
【实施或试行日期】:
【发布单位】:国际标准化组织(IX-ISO)
【起草单位】:VAM
【标准类型】:()
【标准水平】:()
【中文主题词】:
【英文主题词】:Crystalline;Definition;Definitions;Determination;Materials;Materialstesting;Mathematicalcalculations;Measuringtechniques;Neutrondiffraction;Non-destructivetesting;Polycrystallinesemiconductor;Residualstresses
【摘要】:ThisTechnologyTrendsAssessmentspecifiesatestmethodfordeterminingresidualstressesinpolycrystallinematerialsbyneutrondiffraction.Itmaybeappliedtohomogeneousandinhomogeneousmaterialsandtotestpiecescontainingdistinctphases.Theprinciplesoftheneutrondiffractiontechniqueareoutlined.Adviceisprovidedonthecrystallineplanesonwhichmeasurementsshouldbemadefordifferentcategoriesofmaterials.Guidanceisprovidedaboutthedirectionsinwhichthemeasurementsshouldbeobtainedandofthevolumeofmaterialwhichshouldbeexamined,inrelationtomaterialgrainsizeandthestressstateenvisaged,whenmakingmeasurements.Proceduresaredescribedforaccuratelypositioningandaligningtestpiecesinaneutronbeamandforpreciselydefiningthevolumeofmaterialthatissampledwhenindividualmeasurementsarebeingmade.Theprecautionsneededforcalibratingtheneutrondiffractionfacilitiesaredescribed.Techniquesforobtainingastress-freereferencearepresented.Themethodsofdeterminingindividualelasticstrainsbyneutrondiffractionaredescribedindetail.Proceduresforanalysingtheresultsandfordeterminingtheirstatisticalrelevancearepresented.Adviceisprovidedonhowtodeterminereliableestimatesofresidual(orapplied)stressfromthestraindataandofhowtoestimatetheuncertaintyintheresults.
【中国标准分类号】:H80
【国际标准分类号】:19_100
【页数】:61P.;A4
【正文语种】:其他
【原文标准名称】:多晶材料中子衍射法测定剩余应力
【标准号】:ISO/TTA3-2001
【标准状态】:现行
【国别】:国际
【发布日期】:
【实施或试行日期】:
【发布单位】:国际标准化组织(IX-ISO)
【起草单位】:VAM
【标准类型】:()
【标准水平】:()
【中文主题词】:
【英文主题词】:Crystalline;Definition;Definitions;Determination;Materials;Materialstesting;Mathematicalcalculations;Measuringtechniques;Neutrondiffraction;Non-destructivetesting;Polycrystallinesemiconductor;Residualstresses
【摘要】:ThisTechnologyTrendsAssessmentspecifiesatestmethodfordeterminingresidualstressesinpolycrystallinematerialsbyneutrondiffraction.Itmaybeappliedtohomogeneousandinhomogeneousmaterialsandtotestpiecescontainingdistinctphases.Theprinciplesoftheneutrondiffractiontechniqueareoutlined.Adviceisprovidedonthecrystallineplanesonwhichmeasurementsshouldbemadefordifferentcategoriesofmaterials.Guidanceisprovidedaboutthedirectionsinwhichthemeasurementsshouldbeobtainedandofthevolumeofmaterialwhichshouldbeexamined,inrelationtomaterialgrainsizeandthestressstateenvisaged,whenmakingmeasurements.Proceduresaredescribedforaccuratelypositioningandaligningtestpiecesinaneutronbeamandforpreciselydefiningthevolumeofmaterialthatissampledwhenindividualmeasurementsarebeingmade.Theprecautionsneededforcalibratingtheneutrondiffractionfacilitiesaredescribed.Techniquesforobtainingastress-freereferencearepresented.Themethodsofdeterminingindividualelasticstrainsbyneutrondiffractionaredescribedindetail.Proceduresforanalysingtheresultsandfordeterminingtheirstatisticalrelevancearepresented.Adviceisprovidedonhowtodeterminereliableestimatesofresidual(orapplied)stressfromthestraindataandofhowtoestimatetheuncertaintyintheresults.
【中国标准分类号】:H80
【国际标准分类号】:19_100
【页数】:61P.;A4
【正文语种】:其他
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